Surface investigation using atomic force microscopy
In order to better understand the surface properties of our nanostructures, we use extremely sharp tips, which are scanned over the sample like a cane.
This systematic scanning allows the topography of nanometer-sized objects to be precisely detected. Furthermore, advanced methods allow us not only to measure the topography, but also the magnetic and electrical properties of nanostructures, to manipulate them or to focus light on an almost atomic scale using special tips.